• DocumentCode
    1125523
  • Title

    Short-pulse effects in a free-electron laser

  • Author

    Bakker, R.J. ; Jaroszynski, D.A. ; van der Meer, A.F.G. ; Oepts, D. ; van Amersfoort, P.W.

  • Author_Institution
    EURATOM-FOM, FOM-Inst. voor Plasmafysica Rijnhuizen, Niewegein, Netherlands
  • Volume
    30
  • Issue
    7
  • fYear
    1994
  • fDate
    7/1/1994 12:00:00 AM
  • Firstpage
    1635
  • Lastpage
    1644
  • Abstract
    The Free-Electron Laser for Infrared eXperiments (FELIX) offers a unique combination of short electron bunches and long wavelengths, i.e. a slippage parameter μc ranging up to 10. As a consequence, pronounced short-pulse effects can be observed. In this paper the experimental observation of two of these effects is discussed, namely the occurrence of limit-cycle oscillations and the feasibility of tuning of the micropulse duration. The stable limit-cycle oscillation of the macropulse power is due to a modulation of the optical micropulse shape. This is a consequence of a combination of high optical power and short pulses. The former causes synchrotron oscillations of the electrons and the effect is, therefore, closely related to spiking phenomena. The short-pulse nature of FELIX ensures that the oscillations do not evolve into the chaotic behavior normally associated with spiking and the sideband instability. Experimental results are compared with numerical simulations
  • Keywords
    free electron lasers; laser tuning; limit cycles; FELIX; free-electron laser; infrared wavelengths; limit-cycle oscillations; macropulse optical power; micropulse duration tuning; numerical simulations; optical micropulse shape modulation; short electron bunches; short-pulse effects; sideband instability; slippage parameter; spiking; synchrotron oscillations; Chaos; Electron optics; Free electron lasers; Laser tuning; Limit-cycles; Optical modulation; Optical pulses; Optical tuning; Shape; Synchrotrons;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.299495
  • Filename
    299495