Title :
Fading and polarization noise of a PCM/PL system
Author :
Peters, W.N. ; Arguello, R.J.
Author_Institution :
Perkin-Elmer Corp., Wilton, CT, USA
fDate :
6/1/1967 12:00:00 AM
Keywords :
Apertures; Background noise; Error analysis; Error probability; Fading; Optical noise; Optical polarization; Optical receivers; Phase change materials; Phase noise;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1967.1074551
