Abstract :
This article discusses a frequency-domain system identification method developed to address specific challenges arising in the SIM application. The main challenges concern the need to incorporate frequency-weighted performance measures as well as the need to treat large systematic errors occurring naturally in the intended application. In general, systematic errors enter into frequency-domain analysis through various pathways, such as finite data lengths, the choice of window function (for example, Hanning or Hamming) used for spectral estimation, the presence of large low-frequency signal components, and artifacts of detrending filters.
Keywords :
aerospace instrumentation; astronomical techniques; frequency-domain analysis; interferometry; NASA SIM application; detrending filter artifacts; finite data length; frequency domain analysis; frequency domain system identification method; frequency weighted performance measures; low frequency signal components; sensor noise model identification; space interferometer mission; spectral estimation; systematic errors; window function; Cameras; Extraterrestrial measurements; Metrology; Monte Carlo methods; NASA; Optical computing; Optical filters; Optical interferometry; Optical noise; Optical sensors;
