DocumentCode :
11259
Title :
Maximum Sample Volume for Permittivity Measurements by Cavity Perturbation Technique
Author :
Zhiwei Peng ; Jiann-Yang Hwang ; Andriese, Matthew
Author_Institution :
Dept. of Mater. Sci. & Eng., Michigan Technol. Univ., Houghton, MI, USA
Volume :
63
Issue :
2
fYear :
2014
fDate :
Feb. 2014
Firstpage :
450
Lastpage :
455
Abstract :
The maximum sample volume for accurate permittivity measurements of dielectric materials having various geometries (rod/bar, strip/disk, and sphere) by cavity perturbation technique has been investigated by determining the maximum volume ratio of sample to cavity (Vs/Vc)max based on analysis of the measurement theory. It is demonstrated that (Vs/Vc)max of a dielectric rod/bar with the height equal to that of resonant cavity relies exclusively on the relative dielectric constant, whereas (Vs/Vc)max of a dielectric strip/disk or sphere depends on both the relative dielectric constant and the dielectric loss factor. There is a relatively weak permittivity dependence of (Vs/Vc)max for dielectric property measurements of dielectric strips/disks compared with rods/bars or spheres. The maximum sample volume used in the measurements for different sample geometries follows the order: . Comparison between (Vs/Vc)max of low-loss Al2O3 and high-loss SiC reveals that low-loss materials can have a larger sample volume than high-loss materials for measurement. High-loss materials may require a strip/disk geometry to meet the measurement requirements. The variation in (Vs/Vc)max of Al2O3 having different geometries in a broad temperature range up to ~ 1400°C shows that (Vs/Vc)max of the sample decreases with increasing temperature and the change in (Vs/Vc)max should be considered during the high-temperature permittivity measurements.
Keywords :
aluminium compounds; dielectric devices; dielectric loss measurement; dielectric materials; measurement theory; permittivity measurement; perturbation techniques; silicon compounds; Al2O3; SiC; dielectric constant; dielectric loss factor; dielectric material; dielectric property measurement; dielectric rod-bar; dielectric sphere; dielectric strip-disk; geometry; high-temperature permittivity measurement; maximum sample volume ratio; measurement theory; relative dielectric constant; resonant cavity perturbation technique; Cavity resonators; Dielectrics; Materials; Permittivity; Permittivity measurement; Temperature measurement; Cavity perturbation technique (CPT); frequency shift; permittivity measurement; sample geometry; temperature; volume;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2013.2279496
Filename :
6600967
Link To Document :
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