DocumentCode :
1126454
Title :
Statistical Timing Analysis in the Presence of Signal-Integrity Effects
Author :
Kahng, Andrew ; Bao Liu ; Xu Xu
Author_Institution :
Univ. of California, San Diego
Volume :
26
Issue :
10
fYear :
2007
Firstpage :
1873
Lastpage :
1877
Abstract :
Signal-integrity effects have significant impacts on very large-scale-integration performance variation and must be taken into account in statistical timing analysis. In this paper, we study the signal-propagation-delay variation that is induced by crosstalk aggressor signals. We establish a functional relationship between the signal propagation delay and the crosstalk aggressor signal alignment by deterministic circuit simulation and derive closed-form formulas for the statistical distributions of output signal arrival times. Our proposed method can be smoothly integrated into a static timing analyzer, wherein runtime is dominated by sampling the deterministic delay calculation, while probabilistic computation and updating take constant time. Experimental results based on the 1000- global interconnect structures in Berkeley Predictive Technology Model 70-nm technology and industry designs in 130-nm technology show that lack of statistical crosstalk aggressor signal alignment consideration could lead to up to 114.65% (71.26%) differences in interconnect-delay means (standard deviations) and 159.4% (147.4%) differences in gate-delay means (standard deviations). By contract, the method in our earlier work gives within 1.28% (3.38%) mismatch in interconnect output signal arrival time means (standard deviations) and within 2.57% (3.86%) mismatch in gate output signal arrival time means (standard deviations), respectively.
Keywords :
VLSI; crosstalk; integrated circuit design; integrated circuit interconnections; statistical distributions; 130-nm technology; Berkeley Predictive Model 70-nm technology; VLSI; crosstalk aggressor signals; deterministic circuit simulation; global interconnect structures; signal propagation-delay variation; signal-integrity effects; static timing analyzer; statistical distributions; statistical timing analysis; very large-scale-integration; Circuit simulation; Crosstalk; Integrated circuit interconnections; Performance analysis; Propagation delay; Runtime; Sampling methods; Signal analysis; Statistical distributions; Timing; Design; reliability; verification;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2007.895771
Filename :
4305247
Link To Document :
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