• DocumentCode
    11266
  • Title

    IRD Digital Background Calibration of SAR ADC With Coarse Reference ADC Acceleration

  • Author

    Guanhua Wang ; Kacani, Foti ; Yun Chiu

  • Author_Institution
    Analog & Mixed-Signal Lab., Univ. of Texas, Dallas, TX, USA
  • Volume
    61
  • Issue
    1
  • fYear
    2014
  • fDate
    Jan. 2014
  • Firstpage
    11
  • Lastpage
    15
  • Abstract
    A coarse analog-to-digital converter (ADC) is used as the reference path to resolve the input interference problem in correlation-based background calibration of multistep ADCs. A 16-bit successive-approximation-register (SAR) ADC employing a subbinary architecture is calibrated with an 8-bit reference path, achieving a nearly 20 × reduction in convergence time and greatly improved steady-state linearity performance in simulation. The SAR ADC bit-weight calibration is based on the principle of internal redundancy dithering (IRD), a technique in which the bit decision thresholds are dithered by a pseudorandom bit sequence (PRBS) within the redundancy region. Aided by the coarse reference ADC, behavioral simulation shows that 89-dB signal-to-noise plus distortion ratio and the 115-dB spurious-free dynamic range (SFDR) are achievable with the proposed calibration for a SAR ADC with 1% digital-to-analog converter mismatch errors.
  • Keywords
    analogue-digital conversion; random sequences; IRD digital background calibration; SAR ADC bit-weight calibration; SFDR; behavioral simulation; bit decision threshold; coarse analog-to-digital converter; coarse reference ADC acceleration; convergence time; correlation-based background calibration; digital-to-analog converter mismatch errors; input interference problem; internal redundancy dithering; multistep ADC; pseudorandom bit sequence; redundancy region; reference path; signal-to-noise-plus-distortion ratio; spurious-free dynamic range; steady-state linearity performance; subbinary architecture; successive-approximation-register ADC; Acceleration; Calibration; Capacitors; Convergence; Correlation; Noise; Redundancy; Analog-to-digital converter (ADC); background calibration; correlation; internal redundancy dithering (IRD); reference analog-to-digital converter (ADC); successive approximation;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2013.2291051
  • Filename
    6678701