DocumentCode :
11266
Title :
IRD Digital Background Calibration of SAR ADC With Coarse Reference ADC Acceleration
Author :
Guanhua Wang ; Kacani, Foti ; Yun Chiu
Author_Institution :
Analog & Mixed-Signal Lab., Univ. of Texas, Dallas, TX, USA
Volume :
61
Issue :
1
fYear :
2014
fDate :
Jan. 2014
Firstpage :
11
Lastpage :
15
Abstract :
A coarse analog-to-digital converter (ADC) is used as the reference path to resolve the input interference problem in correlation-based background calibration of multistep ADCs. A 16-bit successive-approximation-register (SAR) ADC employing a subbinary architecture is calibrated with an 8-bit reference path, achieving a nearly 20 × reduction in convergence time and greatly improved steady-state linearity performance in simulation. The SAR ADC bit-weight calibration is based on the principle of internal redundancy dithering (IRD), a technique in which the bit decision thresholds are dithered by a pseudorandom bit sequence (PRBS) within the redundancy region. Aided by the coarse reference ADC, behavioral simulation shows that 89-dB signal-to-noise plus distortion ratio and the 115-dB spurious-free dynamic range (SFDR) are achievable with the proposed calibration for a SAR ADC with 1% digital-to-analog converter mismatch errors.
Keywords :
analogue-digital conversion; random sequences; IRD digital background calibration; SAR ADC bit-weight calibration; SFDR; behavioral simulation; bit decision threshold; coarse analog-to-digital converter; coarse reference ADC acceleration; convergence time; correlation-based background calibration; digital-to-analog converter mismatch errors; input interference problem; internal redundancy dithering; multistep ADC; pseudorandom bit sequence; redundancy region; reference path; signal-to-noise-plus-distortion ratio; spurious-free dynamic range; steady-state linearity performance; subbinary architecture; successive-approximation-register ADC; Acceleration; Calibration; Capacitors; Convergence; Correlation; Noise; Redundancy; Analog-to-digital converter (ADC); background calibration; correlation; internal redundancy dithering (IRD); reference analog-to-digital converter (ADC); successive approximation;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2013.2291051
Filename :
6678701
Link To Document :
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