Title :
Infrared microscopy study of anomalous latchup characteristics due to current redistribution in different parasitic paths
Author :
Canali, Claudio ; Corsi, Francesco ; Muschitiello, Michele ; Zanoni, Enrico
Author_Institution :
Dept. of Electron. & Inf., Padova Univ., Italy
fDate :
5/1/1989 12:00:00 AM
Abstract :
Anomalous effects such as abrupt variations of the latchup current in steady-state conditions and window effects, i.e. the existence of a well-defined interval of I/O injected currents for latchup to occur, can occur during pulsed latchup tests. Infrared microscopy allows the correlation of electrical characteristics with latchup current distribution and reveals that anomalous effects are due to the dynamic competition between different latchup paths. This is confirmed by a SPICE simulation of the lumped equivalent circuit of a CMOS output comprising two coupled p-n-p-n parasitic structures
Keywords :
CMOS integrated circuits; current distribution; integrated circuit testing; optical microscopy; CMOS output; I/O injected currents; IR microscopy; SPICE simulation; anomalous latchup characteristics; coupled p-n-p-n parasitic structures; current redistribution; electrical characteristics; lumped equivalent circuit; parasitic paths; pulsed latchup tests; window effects; Circuit simulation; Circuit testing; Coupling circuits; Current distribution; Integrated circuit testing; Irrigation; Pulse circuits; SPICE; Scanning electron microscopy; Steady-state;
Journal_Title :
Electron Devices, IEEE Transactions on
