• DocumentCode
    1126647
  • Title

    Characterization and Modeling of the Voltage Dependency of Capacitance and Impedance Frequency Characteristics of Packed EDLCs

  • Author

    Funaki, Tsusyoshi ; Hikihara, Takashi

  • Author_Institution
    Dept. of Electr. Eng., Kyoto Univ., Kyoto
  • Volume
    23
  • Issue
    3
  • fYear
    2008
  • fDate
    5/1/2008 12:00:00 AM
  • Firstpage
    1518
  • Lastpage
    1525
  • Abstract
    Frequency characteristics and their dependence on charge voltage for a packed electric double layer capacitor (EDLC), which consists of a series of connected EDLC cells, are characterized and modeled based on small ac signal analysis. The results indicate that rated capacitance of a packed EDLC is valid only at frequencies lower than 0.01 Hz at the rated charge voltage but the capacitance is lower for frequencies higher than 0.01 Hz and for lower charge voltages. A conventional simple RC-equivalent circuit, consisting of a capacitor and a resistance in series, is inadequate for expressing EDLC frequency characteristics; therefore, a second-order RC equivalent circuit is used as a model for a packed EDLC. The charge voltage dependency in the frequency characteristics of packed EDLC is evaluated, based on this equivalent circuit. The parameters of the equivalent circuit and their charge voltage dependencies are evaluated from the results. The proposed packed EDLC model is validated by charge and discharge operations in an experimental circuit. The results show that the model can accurately assess the charge stored in a packed EDLC.
  • Keywords
    capacitor storage; capacitors; equivalent circuits; RC-equivalent circuit; capacitance voltage dependency; discharge operations; electric double layer capacitor; equivalent circuit; impedance frequency characteristics; packed EDLC; small ac signal analysis; Capacitive energy storage; frequency response; modeling; voltage dependency;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2008.921156
  • Filename
    4484947