DocumentCode :
1127078
Title :
Reinforcement of linear structure using parametrized relaxation labeling
Author :
Duncan, James S. ; Birkhölzer, Thomas
Author_Institution :
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
Volume :
14
Issue :
5
fYear :
1992
fDate :
5/1/1992 12:00:00 AM
Firstpage :
502
Lastpage :
515
Abstract :
The problem of reinforcing local evidence of linear structure while suppressing unwanted information in noisy images is considered, using a modified form of relaxation labeling. The methodology is based on parametrizing a continuous set of orientation labels via a single vector and using a sigmoidal thresholding function to bias neighborhood influence and ensure convergence to a meaningful stable state. Label strength and label/no-label decisions are incorporated into a single functional. Optimal points of the functional represent the cases where as many pixels (objects) as possible have achieved the desirable linear-structure-reinforced and noise-suppressed labelings. Three different linear structure reinforcement tasks are considered within the general framework: edge reinforcement, edge reinforcement with thinning, and bar (line segment) reinforcement. Results from several image data sets are presented. This approach can directly handle continuous feature information from low-level image analysis operators, and the computational complexity of labeling is reduced
Keywords :
computational complexity; picture processing; bar reinforcement; computational complexity; convergence; edge reinforcement; information suppression; label strength; line segment reinforcement; linear structure reinforcement; local evidence; neighbourhood influence biassing; noise-suppressed labelings; noisy images; orientation labels; parametrized relaxation labeling; sigmoidal thresholding function; thinning; Computed tomography; Convergence; Ear; Image analysis; Image edge detection; Image motion analysis; Image segmentation; Image texture analysis; Labeling; Pixel;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.134056
Filename :
134056
Link To Document :
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