Title :
Transmission properties of metal-semiconductor-relaxor microstrip lines
Author :
Fiallo, Héctor H. ; Dougherty, Joseph P. ; Sei-Joo Jang ; Newnham, Robert E. ; Carpenter, Lynn A.
Author_Institution :
Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
fDate :
7/1/1994 12:00:00 AM
Abstract :
The transmission characteristics of multilayer ferrite-high-K microstrip lines have been calculated by means of the parallel-plate waveguide approximation. The relaxation behavior of the dielectric permittivity and permeability have been taken into account by using the Debye and the Maxwell-Wagner relaxation models. The results demonstrate that these lines can be used as very small size delay lines and low-pass filters that can be tuned by adjusting the layer thickness ratio, the resistivity of the semiconductor layer, and the difference between the permittivity-permeability product of each layer
Keywords :
ferrite applications; frequency response; microstrip lines; permeability; permittivity; relaxation; waveguide theory; Debye relaxation model; Maxwell-Wagner relaxation model; delay lines; dielectric permeability; dielectric permittivity; low-pass filters; metal-semiconductor-relaxor microstrip lines; multilayer ferrite-high-K microstrip lines; parallel-plate waveguide approximation; relaxation behavior; semiconductor layer resistivity; transmission characteristics; Conductivity; Delay lines; Dielectric substrates; Ferrites; Frequency; Low pass filters; Microstrip; Nonhomogeneous media; Permeability; Permittivity;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
