DocumentCode :
1127204
Title :
Analysis of radiation from an open-ended coaxial line into stratified dielectrics
Author :
Bakhtiari, Sasan ; Ganchev, Stoyan I. ; Zoughi, Reza
Author_Institution :
Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
Volume :
42
Issue :
7
fYear :
1994
fDate :
7/1/1994 12:00:00 AM
Firstpage :
1261
Lastpage :
1267
Abstract :
Radiation from an open-ended coaxial transmission line into an N-layer dielectric medium is studied in application to nondestructive evaluation of materials. Explicit formulations for two cases of layered media, one terminated into an infinite half-space and the other into a conducting sheet are addressed in general form. In the theoretical derivations it is assumed that only the fundamental TEM mode propagates inside the coaxial line. The terminating admittance of the line is then formulated using the continuity of the power flow across the aperture. The admittance expressions for specific cases of two-layer dielectric composite with generally lossy dielectric properties, and a two-layer composite backed by a conducting sheet are presented and inspected explicitly. The numerical results of the aperture admittance formulation are discussed and compared with the available infinite half-space model which had been experimentally verified
Keywords :
coaxial cables; dielectric measurement; electric admittance; electric sensing devices; microwave measurement; nondestructive testing; transmission line theory; N-layer dielectric medium; aperture admittance formulation; coaxial transmission line; conducting sheet; fundamental TEM mode; materials testing; nondestructive evaluation; open-ended coaxial line; radiation analysis; stratified dielectrics; terminating admittance; two-layer dielectric composite; Admittance; Apertures; Coaxial components; Conducting materials; Dielectric losses; Dielectric materials; Nonhomogeneous media; Power transmission lines; Sheet materials; Transmission line theory;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.299765
Filename :
299765
Link To Document :
بازگشت