• DocumentCode
    1127262
  • Title

    Results from the CRRES MEP experiment

  • Author

    Campbell, Arthur ; McDonald, Patrick ; Gonyea, Richard ; Reeves, Michelle

  • Author_Institution
    Naval Res. Lab., Washington, DC, USA
  • Volume
    41
  • Issue
    3
  • fYear
    1994
  • fDate
    6/1/1994 12:00:00 AM
  • Firstpage
    432
  • Lastpage
    437
  • Abstract
    The effects of space radiation on microelectronics devices will be presented as measured by the Microelectronics Package Space Experiment on the Combined Release and Radiation Effects Satellite
  • Keywords
    SRAM chips; artificial satellites; radiation effects; Combined Release and Radiation Effects Satellite; Microelectronics Package Space Experiment; microelectronics devices; single event upset; space radiation; Belts; Circuit testing; Earth; Extraterrestrial measurements; Microelectronics; Packaging; Protons; Radiation effects; Satellites; Single event transient;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.299780
  • Filename
    299780
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1127262