Title :
Results from the CRRES MEP experiment
Author :
Campbell, Arthur ; McDonald, Patrick ; Gonyea, Richard ; Reeves, Michelle
Author_Institution :
Naval Res. Lab., Washington, DC, USA
fDate :
6/1/1994 12:00:00 AM
Abstract :
The effects of space radiation on microelectronics devices will be presented as measured by the Microelectronics Package Space Experiment on the Combined Release and Radiation Effects Satellite
Keywords :
SRAM chips; artificial satellites; radiation effects; Combined Release and Radiation Effects Satellite; Microelectronics Package Space Experiment; microelectronics devices; single event upset; space radiation; Belts; Circuit testing; Earth; Extraterrestrial measurements; Microelectronics; Packaging; Protons; Radiation effects; Satellites; Single event transient;
Journal_Title :
Nuclear Science, IEEE Transactions on
