Title :
A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip
Author :
Cota, E. ; Kastensmidt, F.L. ; Cassel, M. ; Herve, M. ; Almeida, P. ; Meirelles, P. ; Amory, A. ; Lubaszewski, M.
Author_Institution :
Univ. Fed. do Rio Grande do Sul, Porto Alegre
Abstract :
A novel strategy to detect interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control and communication handshake lines are considered in a cost-effective test sequence for Mesh NoC topologies based on XY routing.
Keywords :
integrated circuit interconnections; integrated circuit testing; network-on-chip; XY routing; fault-coverage approach; mesh NoC topology; network-on-chip; Interconnections (Subsystems); Reliability; Testing; and Fault-Tolerance;
Journal_Title :
Computers, IEEE Transactions on
