DocumentCode :
1127361
Title :
Modelling threshold shift of power laser diodes under neutronic and photonic irradiation
Author :
Jolly, A. ; Vicrey, J.
Author_Institution :
CEA, Centre d´´Etudes de Bruyeres-le-Chatel, France
Volume :
41
Issue :
3
fYear :
1994
fDate :
6/1/1994 12:00:00 AM
Firstpage :
503
Lastpage :
509
Abstract :
The current threshold of high power GaAlAs laser arrays is shown to be strongly increased by fission neutron fluences, in the range 10 14 n/cm2. The current threshold after irradiation, whose value may be twice that of the unirradiated device, is associated to an anode-cathode voltage displacement. After having proved these effects are neutron specific effects, we shall propose a simplified diffusion model, which takes into account both the electrical and electro-optical threshold effects. Distributed trapped charges are assumed to modify the carrier profiles inside the active layer, Simulation configurations are described with fitting results, and we conclude that a trapped charge density in the 1014 cm-3 range may be justified
Keywords :
gallium arsenide; gamma-ray effects; neutron effects; semiconductor device models; semiconductor lasers; anode-cathode voltage displacement; carrier profiles; diffusion model; electrical effects; electro-optical threshold effects; fission neutrons; gamma irradiation; high power GaAlAs laser arrays; neutron irradiation; power laser diodes; threshold shift; trapped charge density; Diode lasers; Laser modes; Neutrons; Optical arrays; Optical materials; Power lasers; Semiconductor laser arrays; Space technology; Stimulated emission; Testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.299790
Filename :
299790
Link To Document :
بازگشت