Title :
Discrimination Between Log-Normal and Weibull Clutter
Author :
Szajnowski, W.J.
Author_Institution :
Warsaw Technical University
Abstract :
Two simple tests are presented for classifying a set of clutter samples into either the log-normal or Weibull distribution. The results obtained by Monte Carlo simulation have shown that both of these tests are only slightly inferior to the test based on the ratio of maximized likelihoods. An application to constant false-alarm rate (CFAR) processing is also discussed.
Keywords :
Clutter; Detectors; Hardware; Parameter estimation; Pattern recognition; Radar detection; Shape; Statistical distributions; Testing; Weibull distribution;
Journal_Title :
Aerospace and Electronic Systems, IEEE Transactions on
DOI :
10.1109/TAES.1977.308413
