DocumentCode
1127766
Title
A Novel Statistical Method for Automatically Partitioning Tools According to Engineers´ Tolerance Control in Process Improvement
Author
Tu, Kevin Kai-Wen ; Lee, Jack Chao-Sheng ; Lu, Henry Horng-Shing
Author_Institution
Macronix Int. Co., Ltd., Hsinchu, Taiwan
Volume
22
Issue
3
fYear
2009
Firstpage
373
Lastpage
380
Abstract
In the semiconductor industry, tool comparison is a key task in yield or product quality enhancements. We develop a new method to automatically partition tools. The new method is called tolerance control partitioning (TCP). The advantages of TCP include 1) taking into account of unbalanced tool usage in manufacturing processes; 2) further partitioning these tools into several homogenous groups by related metrology results instead of detecting only the significant difference; and 3) partitioning these tools according to engineers´ tolerance controls to avoid too many groups with small differences. TCP also could be applied in all similar cases such as experimental recipe or material comparisons. Therefore, using TCP, engineers could speed up yield or product quality ramping.
Keywords
manufacturing processes; production control; production engineering; quality control; semiconductor industry; statistical analysis; tolerance analysis; manufacturing processes; product quality; semiconductor industry; statistical method; tolerance control partitioning; unbalanced tool usage; yield quality; $C_{pk}$ ; $C_{p}$ ; APC; Bayesian fit; CART; data mining; process capability; reversible jump Markov chain Monte Carlo; yield enhancement;
fLanguage
English
Journal_Title
Semiconductor Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
0894-6507
Type
jour
DOI
10.1109/TSM.2009.2025812
Filename
5159414
Link To Document