• DocumentCode
    1127766
  • Title

    A Novel Statistical Method for Automatically Partitioning Tools According to Engineers´ Tolerance Control in Process Improvement

  • Author

    Tu, Kevin Kai-Wen ; Lee, Jack Chao-Sheng ; Lu, Henry Horng-Shing

  • Author_Institution
    Macronix Int. Co., Ltd., Hsinchu, Taiwan
  • Volume
    22
  • Issue
    3
  • fYear
    2009
  • Firstpage
    373
  • Lastpage
    380
  • Abstract
    In the semiconductor industry, tool comparison is a key task in yield or product quality enhancements. We develop a new method to automatically partition tools. The new method is called tolerance control partitioning (TCP). The advantages of TCP include 1) taking into account of unbalanced tool usage in manufacturing processes; 2) further partitioning these tools into several homogenous groups by related metrology results instead of detecting only the significant difference; and 3) partitioning these tools according to engineers´ tolerance controls to avoid too many groups with small differences. TCP also could be applied in all similar cases such as experimental recipe or material comparisons. Therefore, using TCP, engineers could speed up yield or product quality ramping.
  • Keywords
    manufacturing processes; production control; production engineering; quality control; semiconductor industry; statistical analysis; tolerance analysis; manufacturing processes; product quality; semiconductor industry; statistical method; tolerance control partitioning; unbalanced tool usage; yield quality; $C_{pk}$; $C_{p}$; APC; Bayesian fit; CART; data mining; process capability; reversible jump Markov chain Monte Carlo; yield enhancement;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2009.2025812
  • Filename
    5159414