DocumentCode
1128203
Title
Nonlinear limits for single-crystal silicon microresonators
Author
Kaajakari, Ville ; Mattila, Tomi ; Oja, Aarne ; Seppä, Heikki
Volume
13
Issue
5
fYear
2004
Firstpage
715
Lastpage
724
Abstract
Nonlinear effects in single-crystal silicon microresonators are analyzed with the focus on mechanical nonlinearities. The bulk acoustic wave (BAW) resonators are shown to have orders-of-magnitude higher energy storage capability than flexural beam resonators. The bifurcation point for the silicon BAW resonators is measured and the maximum vibration amplitude is shown to approach the intrinsic material limit. The importance of nonlinearities in setting the limit for vibration energy storage is demonstrated in oscillator applications. The phase noise calculated for silicon microresonator-based oscillators is compared to the conventional macroscopic quartz-based oscillators, and it is shown that the higher energy density attainable with the silicon resonators can partially compensate for the small microresonator size. Scaling law for microresonator phase noise is developed.
Keywords
bifurcation; bulk acoustic wave devices; crystal oscillators; elemental semiconductors; micromechanical resonators; phase noise; silicon; Si; bifurcation point; bulk acoustic wave resonators; energy storage capability; flexural beam resonators; hysteresis; intrinsic material limit; macroscopic quartz-based oscillators; mechanical nonlinearity; microresonator phase noise; nonlinear effects; nonlinear limits; nonlinear oscillators; oscillator applications; oscillator noise; scaling law; silicon BAW resonators; silicon microresonator-based oscillators; single-crystal silicon microresonators; vibration amplitude; vibration energy storage; Acoustic beams; Acoustic measurements; Acoustic waves; Bifurcation; Energy storage; Microcavities; Oscillators; Phase noise; Silicon; Vibration measurement; BAW; Bifurcation; bulk acoustic wave; devices; hysteresis; microresonators; nonlinear oscillators; nonlinearities; oscillator noise; oscillators; phase noise; resonators;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/JMEMS.2004.835771
Filename
1341447
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