DocumentCode :
1128498
Title :
Understanding the ultra-low intersubband saturation intensity in InGaAs-AlAsSb quantum wells
Author :
Gopal, Achanta Venu ; Yoshida, Haruhiko ; Simoyama, Takasi ; Georgiev, Nikolai ; Mozume, Teruo ; Ishikawa, Hiroshi
Author_Institution :
Femtosecond Technol. Res. Assoc., Tsukuba, Japan
Volume :
39
Issue :
2
fYear :
2003
fDate :
2/1/2003 12:00:00 AM
Firstpage :
299
Lastpage :
305
Abstract :
We report a novel intersubband material system based on strained InGaAs-AlAs-AlAsSb quantum wells that exhibits a very low, 3 fJ/μm2, saturation intensity and about 2-ps carrier-relaxation time at 1.68 μm. We performed a density matrix calculation to estimate the saturation intensity by simulating the pulsed excitation conditions of the experiment. These studies indicate slow dephasing time and reduced inhomogeneity as the possible mechanisms for the observed large nonlinearity. A detailed dephasing time calculation shows that rather than the reduction in the electron effective mass in these strained quantum wells (QWs), the effect of enhanced concentration of doped carriers in these QWs with reduced inhomogeneity could be the origin of slow dephasing and the observed large nonlinearity.
Keywords :
III-V semiconductors; aluminium compounds; carrier relaxation time; gallium arsenide; indium compounds; optical switches; semiconductor quantum wells; visible spectra; 1.68 micron; 2 ps; InGaAs-AlAs-AlAsSb; InP; InP substrate; all-optic switch; carrier-relaxation time; density matrix calculation; electron effective mass; enhanced doped carrier concentration; intersubband material system; large nonlinearity; pulsed excitation conditions; reduced inhomogeneity; slow dephasing time; strained InGaAs-AlAs-AlAsSb quantum wells; switching energy; ultra-low intersubband saturation intensity; Absorption; Communication networks; Communication switching; Doping; Effective mass; Electrons; Logic functions; Pattern recognition; Switches; Venus;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2002.807181
Filename :
1172847
Link To Document :
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