Title :
Signature-monitoring technique based on instruction-bit grouping
Author :
Chen, Y.-Y. ; Leu, K.-L.
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Chung-Hua Univ., Hsin-Chu, Taiwan
fDate :
7/8/2005 12:00:00 AM
Abstract :
A new concurrent error-detection scheme monitors the signatures in online detection of instruction memory and control flow errors caused by transient and intermittent faults. The proposed signature-monitoring technique is based on the grouping of column bit information of instructions in a block to produce the block signature. The grouping size that represents the number of bits in a group could affect the fault coverage. It is shown that the fault coverage of a three-bit grouping scheme is better than that of two-bit grouping, and approaches to 1.0. The issue of the effect of state assignment on fault coverage is discussed. A methodology is given that can be used to select a near-optimal state assignment that guarantees a near-optimal fault coverage among all possible state assignments. A software-based simulation is conducted to justify the near-optimal state selected and validate the effectiveness of the proposed techniques. The proposed schemes are implemented in VHDL and hardware-based fault simulations running several benchmark programs verify the results obtained. Comparisons between various schemes are conducted.
Keywords :
error detection; fault tolerant computing; instruction sets; state assignment; VHDL; benchmark programs; block signature; column bit information; concurrent error-detection scheme; control flow errors; fault coverage; hardware-based fault simulations; instruction memory; instruction-bit grouping; intermittent faults; near-optimal fault coverage; near-optimal state assignment; online detection; signature-monitoring technique; software-based simulation; three-bit grouping scheme; transient faults;
Journal_Title :
Computers and Digital Techniques, IEE Proceedings -
DOI :
10.1049/ip-cdt:20045103