DocumentCode :
1128649
Title :
Impact Research of Inductive FCL on the Rate of Rise of Recovery Voltage With Circuit Breakers
Author :
Li, Qingmin ; Liu, Hongshun ; Lou, Jie ; Zou, Liang
Author_Institution :
Sch. of Electr. Eng., Shandong Univ., Jinan
Volume :
23
Issue :
4
fYear :
2008
Firstpage :
1978
Lastpage :
1985
Abstract :
Fault current limiter (FCL) is expected to ease the burden on circuit breakers by limiting the fault current to a desired level. However, the burden on the circuit breakers depends not only on the interrupting current but also on the rate of rise of recovery voltage (RRRV). Based on an equivalent model of the inductive FCL and with respect to FCL terminal fault and short-line fault respectively, strict mathematical formula are presented to describe the relationship between the RRRV and the current limit factor, the stray capacitance as well as the short-line fault distance. Further, detailed computations were carried out regarding a 220-kV transmission line with three-phase-to-ground faults to fully account for the concrete impacts on the RRRV from key influential factors. The calculation results by the proposed theoretical formula in this paper coincide well with the simulations in some previous publications. The specific investigation presents analytical basis and theoretical reference for optimal parameter design of inductive FCLs and reliable selection of the interrupting characteristics of HV circuit breakers.
Keywords :
circuit breakers; fault current limiters; power factor; transmission lines; current limit factor; equivalent model; high voltage circuit breakers; inductive fault current limiter; rate of rise of recovery voltage; short-line fault; stray capacitance; terminal fault; three-phase-to-ground faults; transmission line; voltage 220 kV; Circuit breaker; current limit factor; inductive fault current limiter (FCL); rate of rise of recovery voltage (RRV); short-line fault distance; stray capacitance;
fLanguage :
English
Journal_Title :
Power Delivery, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8977
Type :
jour
DOI :
10.1109/TPWRD.2008.921119
Filename :
4488200
Link To Document :
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