The breakdown mechanism of poly-p-xylylene film. Prestress effects on the breakdown strength

Author

Mori, Tatsuo ; Matsuoka, Toshiki ; Mizutani, Teruyoshi

Author_Institution

Dept. of Electr. Eng., Nagoya Univ., Japan

Volume

1

Issue

1

fYear

1994

fDate

2/1/1994 12:00:00 AM

Firstpage

71

Lastpage

76

Abstract

Impulse and dc breakdown strengths of 4 μm thick poly-p-xylylene (PPX) films were 5.9 and 4.1 MV/cm, respectively. They were independent of temperature in the temperature range from -60 to 60°C. dc prestressing for a long time (t_p=60 s) reduced impulse breakdown strength for both the same and the opposite polarity. But dc prestressing for a short time (t_p<1 s) increased impulse breakdown strength for the same polarity. These results were explained by positive space charge in PPX film. It was also concluded that positive charge carrier injected from the anode, spread in a 4 μm thick PPX film during a short time

Keywords

electric breakdown of solids; impact ionisation; impulse testing; insulation testing; organic insulating materials; polymer films; -60 to 60 C; 4 mum; DC breakdown strength; DC prestressing; breakdown mechanism; electronic avalanche breakdown; impulse breakdown strength; polarity dependence; poly-p-xylylene film; positive charge carrier injection; positive space charge; Avalanche breakdown; Breakdown voltage; Conducting materials; Dielectric thin films; Electric breakdown; Electrodes; Plastic insulation; Polymers; Space charge; Transistors;

fLanguage

English

Journal_Title

Dielectrics and Electrical Insulation, IEEE Transactions on

Publisher

ieee

ISSN

1070-9878

Type

jour

DOI

10.1109/94.300233

Filename

300233