Title :
Weibull statistics in short-term dielectric breakdown of thin polyethylene films [comment and reply]
Author :
Donazzi, F. ; Luoni, G. ; Laurent, C.
fDate :
2/1/1994 12:00:00 AM
Abstract :
For original paper see ibid., vol.28, p18-29 (1993).The comments make it clear and underline that a parameter obtained from ramped voltages bears no relationship whatsoever with the life threshold parameter that would be derived from constant stress experiments. A reply is given
Keywords :
electric breakdown of solids; insulation testing; life testing; organic insulating materials; polymer films; Weibull statistics; constant stress experiments; life threshold parameter; ramped voltages; short-term dielectric breakdown; thin polyethylene films; Breakdown voltage; Dielectric breakdown; Dielectric thin films; Electric breakdown; Electrodes; Plastic films; Polyethylene; Statistics; Stress; Testing;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
