Title :
A reconfiguration-based defect-tolerant design paradigm for nanotechnologies
Author :
He, Chen ; Jacome, Margarida F. ; De Veciana, Gustavo
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Abstract :
This article discusses a novel probabilistic design paradigm targeting reconfigurable architected nanofabrics and points to a promising foundation for comprehensively addressing, at the system level, the density, scalability, and reliability challenges of emerging nanotechnologies. The approach exposes a new class of yield, delay, and cost trade-offs that must be jointly considered when designing computing systems in defect-prone nanotechnologies.
Keywords :
fault tolerance; logic design; logic gates; nanotechnology; reconfigurable architectures; redundancy; defect-tolerant probabilistic design; fault tolerance; molecular electronics; nanofabrics; nanotechnology; reconfigurable architecture; reliability; Costs; Delay; Design methodology; Fabrics; Fault tolerance; Helium; Iris; Nuclear magnetic resonance; Redundancy; Scalability; Nanotechnologies; defect tolerance; probabilistic design; reconfiguration;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2005.76