• DocumentCode
    1128881
  • Title

    A reconfiguration-based defect-tolerant design paradigm for nanotechnologies

  • Author

    He, Chen ; Jacome, Margarida F. ; De Veciana, Gustavo

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
  • Volume
    22
  • Issue
    4
  • fYear
    2005
  • Firstpage
    316
  • Lastpage
    326
  • Abstract
    This article discusses a novel probabilistic design paradigm targeting reconfigurable architected nanofabrics and points to a promising foundation for comprehensively addressing, at the system level, the density, scalability, and reliability challenges of emerging nanotechnologies. The approach exposes a new class of yield, delay, and cost trade-offs that must be jointly considered when designing computing systems in defect-prone nanotechnologies.
  • Keywords
    fault tolerance; logic design; logic gates; nanotechnology; reconfigurable architectures; redundancy; defect-tolerant probabilistic design; fault tolerance; molecular electronics; nanofabrics; nanotechnology; reconfigurable architecture; reliability; Costs; Delay; Design methodology; Fabrics; Fault tolerance; Helium; Iris; Nuclear magnetic resonance; Redundancy; Scalability; Nanotechnologies; defect tolerance; probabilistic design; reconfiguration;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2005.76
  • Filename
    1492291