DocumentCode :
1128884
Title :
SOI Pixel Based on a Floating Body Partially Depleted MOSFET in a Delta-Sigma Loop
Author :
Harik, Louis ; Sallese, Jean-Michel ; Kayal, Maher
Author_Institution :
Dept. of Electr. Eng., Ecole Polytech. Federate de Lausanne, Lausanne, Switzerland
Volume :
9
Issue :
8
fYear :
2009
Firstpage :
994
Lastpage :
1001
Abstract :
Standard techniques used for measuring the photocurrent of an SOI phototransistor have failed due to two main reasons: the first being the low signal-to-noise ratio and the second being the slow transient. In this paper, the partially depleted silicon on insulator (SOI) metal-oxide-semiconductor field effect transistor (MOSFET) has been used as a light intensity sensor. Using a novel technique of measurement enables us to embed this phototransistor in the delta-sigma loop. The presented circuits implement a first-order delta-sigma modulator with limited number of transistors maximizing the fill factor. Measured data show that the implemented pixels were sensitive to flux densities as low as 3 mW/m2 with a resolution of 7.5 bits.
Keywords :
MOSFET; delta-sigma modulation; photodetectors; phototransistors; silicon-on-insulator; SOI pixel; first-order delta-sigma modulator; floating body partially depleted MOSFET; light intensity sensor; metal-oxide-semiconductor field effect transistor; phototransistor; silicon on insulator; Delta modulation; Density measurement; FETs; MOSFET circuits; Measurement standards; Metal-insulator structures; Photoconductivity; Phototransistors; Signal to noise ratio; Silicon on insulator technology; Partially depleted; phototransistors; silicon on insulator (SOI) metal-oxide-semiconductor field effect transistor (MOSFET); transient charge pumping;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2009.2025807
Filename :
5159538
Link To Document :
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