DocumentCode :
1128951
Title :
BIST the hard way
Author :
Davidson, S.
Author_Institution :
Sun Microsystems
Volume :
22
Issue :
4
fYear :
2005
Firstpage :
386
Lastpage :
387
Abstract :
Reviewed in this issue A Designer´s Guide to Built-in Self-Test, by Charles E. Stroud (Springer, 2002, ISBN 1-402-07050-0, 344 pp., $125).
Keywords :
IC; N-detection; built-in self-test; logic; mixed-signal BIST; scan BIST; Automatic testing; Books; Built-in self-test; Computer Society; Engines; Firewire; Logic testing; Programmable logic arrays; Sun; System testing; IC; N-detection; built-in self-test; logic; mixed-signal BIST; scan BIST;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2005.79
Filename :
1492298
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1128951
