• DocumentCode
    1128960
  • Title

    Adding value to design and test through education: What are the challenges?

  • Author

    Carro, Luigi

  • Author_Institution
    Federal University of Rio Grande do Sul
  • Volume
    22
  • Issue
    4
  • fYear
    2005
  • Firstpage
    388
  • Lastpage
    388
  • Abstract
    THE 6TH IEEE Latin American Test Workshop (LATW 05), took place from 30 March to 2 April 2005 in Salvador, Brazil. The workshop included a panel discussion on the challenges for modern design and test education, which attracted much attention from the audience.
  • Keywords
    LATW; design and test; education; industry; universities; Circuits; Computer errors; Computer science education; Conferences; Logic devices; Peer to peer computing; Silicon on insulator technology; System-level design; Technical Councils; Testing; LATW; design and test; education; industry; universities;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2005.77
  • Filename
    1492299
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1128960