Title :
Adding value to design and test through education: What are the challenges?
Author_Institution :
Federal University of Rio Grande do Sul
Abstract :
THE 6TH IEEE Latin American Test Workshop (LATW 05), took place from 30 March to 2 April 2005 in Salvador, Brazil. The workshop included a panel discussion on the challenges for modern design and test education, which attracted much attention from the audience.
Keywords :
LATW; design and test; education; industry; universities; Circuits; Computer errors; Computer science education; Conferences; Logic devices; Peer to peer computing; Silicon on insulator technology; System-level design; Technical Councils; Testing; LATW; design and test; education; industry; universities;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2005.77
