Author :
Kahng, Andrew B.
Author_Institution :
University of California, San Diego
Keywords :
Alpha particles; Circuit noise; Circuit testing; Computer errors; Error correction; Fault tolerant systems; Integrated circuit interconnections; Logic testing; Noise level; Silicon on insulator technology;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2003.1173057
