An Approach to Built-In Testing

The archiitecture and justification for an approach to built-in testing (BIT) in electronic circuits and systems is presented. The proposed system is capable of on-line fault detection and prediction up to the shop replaceable assembly (SRA) level and is designed to interface with external automatic test equipment (ATE) for off-line fault diagnosis within the SRA. The constituent parts of the BIT system have been extensively simulated and the approach appears to be suitable for hardware implementation both with respect to computational and economic considerations.