• DocumentCode
    1129383
  • Title

    Slow-wave structures-based method of measurements

  • Author

    Pchelnikov, Yu.N. ; Nyce, David S.

  • Author_Institution
    Sensors Div., MTS Syst. Corp., Cary, NC, USA
  • Volume
    51
  • Issue
    5
  • fYear
    2002
  • fDate
    10/1/2002 12:00:00 AM
  • Firstpage
    891
  • Lastpage
    896
  • Abstract
    A novel electromagnetic measurement method is described from the physical point of view. Based on the application of slow-wave structures, this method combines the advantages of relatively high and relatively low frequency bands. Concentration of an electromagnetic field, caused by wave deceleration, leads to a significant increase in sensitivity. The main parameters and characteristics of the sensitive elements, built as sections of slow-wave structures, are considered in this paper. It is shown that the electric and magnetic fields split in the transverse direction in sensors based on coupled slow-wave structures. This leads to an additional increase in sensitivity. Some examples of practical slow-wave structure-based measurement methods are also presented.
  • Keywords
    electric sensing devices; frequency response; high-frequency transmission lines; microwave measurement; sensitivity analysis; slow wave structures; transmission line theory; EM field concentration; RF/microwave measurement techniques; SWS; attenuation; coupled slow-wave structure sensors; electromagnetic measurement methods; relatively high/low frequency bands; resonant frequencies; sensitivity increase; slow-wave structure based measurement methods; slow-wave structure sensitive elements; transmission lines; transverse direction electric/magnetic field splitting; wave deceleration; Conductors; Electromagnetic measurements; Electromagnetic scattering; Frequency measurement; Magnetic field measurement; Microwave technology; Radio frequency; Resonance; Resonant frequency; Transmission line measurements;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2002.806011
  • Filename
    1174012