Title :
Thermal dynamic model of precision wire-wound resistors
Author :
Szepessy, Zsolt ; Zoltan, István
Author_Institution :
Dept. of Meas. & Inf. Syst., Budapest Univ. of Technol. & Econ., Hungary
fDate :
10/1/2002 12:00:00 AM
Abstract :
Wire-wound type resistors are often used as reference elements in high-precision electronic instruments of industrial frequencies (50-60 Hz). One of the main factors in the measurement uncertainty of these instruments is the "self-heating" affected drift of the built-in wire-wound resistors. The materials, geometry, construction and the thermal environment of the resistors determine the dynamics of the load-affected drift. This paper investigates a thermal model that can be used for on-line estimation of the load-affected thermal dynamic drift of commercially available encapsulated precision wire-wound resistors. Using the suggested model, the achievable estimation error of the relative change in resistance is below 10%. The model and the model-based on-line error estimation allow reducing the measurement uncertainty of industrial high-precision calibrators and extending the power range of standard resistors in laboratories.
Keywords :
calibration; electric resistance; load (electric); measurement errors; measurement standards; measurement uncertainty; parameter estimation; resistors; thermal analysis; 50 to 60 Hz; electronic instruments; encapsulated wire-wound resistors; estimation error; industrial frequencies; industrial high-precision calibrators; load correction; load-affected drift dynamics; load-affected thermal dynamic drift; measurement uncertainty; model-based on-line error estimation; on-line estimation; precision wire-wound resistors; reference elements; relative resistance change; resistor construction; resistor geometry; resistor materials; self-calibration; self-heating affected drift; standard resistor power range; thermal dynamic model; thermal environment; Building materials; Construction industry; Electronics industry; Frequency; Industrial electronics; Instruments; Measurement uncertainty; Resistors; Thermal loading; Thermal resistance;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2002.806022