DocumentCode :
1129539
Title :
Modeling, calibration, and correction of nonlinear illumination-dependent fixed pattern noise in logarithmic CMOS image sensors
Author :
Joseph, Dileepan ; Collins, Steve
Author_Institution :
Dept. of Eng. Sci., Univ. of Oxford, UK
Volume :
51
Issue :
5
fYear :
2002
fDate :
10/1/2002 12:00:00 AM
Firstpage :
996
Lastpage :
1001
Abstract :
At present, most CMOS image sensors use an array of pixels with a linear response. However, pixels with a logarithmic response are also possible and are capable of imaging high dynamic range scenes without saturating. Unfortunately, logarithmic image sensors suffer from fixed pattern noise (FPN). Work reported in the literature generally assumes the FPN is independent of illumination. This paper develops a nonlinear model y=a+bln(c+x)+ε of a pixel for the digital response y to an illuminance x and shows that the FPN arises from a variation of the offset a, gain b, and bias c from pixel to pixel. Equations are derived to estimate these parameters by calibrating images of uniform stimuli, taken with varying illuminances. Experiments with a Fuga 15d image sensor, demonstrating parameter calibration and FPN correction, show that the nonlinear model outperforms previous models that assume either only offset or offset and gain variation.
Keywords :
CMOS image sensors; calibration; dynamic response; integrated circuit measurement; integrated circuit modelling; integrated circuit noise; lighting; optical saturation; FPN correction; high dynamic range scene imaging; image saturation; linear response pixel arrays; logarithmic CMOS image sensors; logarithmic response pixels; noise modeling/calibration/correction; nonlinear illumination-dependent fixed pattern noise; parameter calibration; pixel illuminance digital response nonlinear models; pixel to pixel offset/gain/bias variation; uniform stimuli image calibration; CMOS image sensors; Calibration; Dynamic range; Image sensors; Layout; Lighting; Nonlinear equations; Pixel; Semiconductor device modeling; Sensor arrays;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2002.807803
Filename :
1174030
Link To Document :
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