Sub-picosecond aperture-uncertainty measurements [ADCs]

Author

Chiorboli, Giovanni

Author_Institution

Dipt. di Ingegneria dell´´Informazione, Univ. degli Studi di Parma, Italy

Volume

51

Issue

5

fYear

2002

fDate

10/1/2002 12:00:00 AM

Firstpage

1039

Lastpage

1044

Abstract

Sub-picosecond aperture-uncertainty measurement is a challenge today in the test of state-of-the-art high-speed, high-resolution A/D converters used in digital receivers. This work describes the existing double-channel techniques and analyzes the measurement accuracy obtainable with the instrumentation available today. Experimental results are provided which validate theory.

Keywords

analogue-digital conversion; correlation methods; error compensation; high-speed integrated circuits; integrated circuit testing; jitter; measurement theory; time measurement; A/D converters; aperture jitter; cross-correlation; digital receivers; double-beat/subtraction technique; double-channel techniques; high-resolution ADC; high-speed ADC; locked-histogram test; measurement accuracy; phase noise; sub-picosecond aperture-uncertainty measurements; test bench effects compensation; Additive noise; Analog-digital conversion; Apertures; Availability; Circuit testing; Instruments; Jitter; Phase noise; Power harmonic filters; Synthesizers;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2002.807799

Filename

1174038