Title :
A WSI approach towards defect/fault-tolerant reconfigurable serial systems
Author :
Chen, Wei ; Mavor, John ; Denyer, Peter B. ; Renshaw, David
Author_Institution :
Dept. of Electr. Eng., Edinburgh Univ., UK
fDate :
6/1/1988 12:00:00 AM
Abstract :
A superchip for realizing ultra-large-scale integrated (ULSI) systems based on a wafer-scale integrated (WSI) circuit concept, which incorporates defect/fault tolerance and system reconfiguration, is introduced. The key features of the central architectural component, a large crossbar switch matrix, are described. A prototype has been fabricated in silicon technology. Hypothetical processor examples demonstrate the power of the superchip approach, and design/performance figures are discussed.<>
Keywords :
CMOS integrated circuits; VLSI; cellular arrays; fault tolerant computing; integrated circuit technology; microprocessor chips; multiprocessing systems; ULSI; WSI; central architectural component; defect tolerant system; fault tolerant reconfigurable serial systems; key features; large crossbar switch matrix; performance; prototype; superchip; system reconfiguration; ultra-large-scale integrated; wafer-scale integrated; Circuit testing; Communication switching; Fault tolerant systems; Integrated circuit technology; Prototypes; Routing; Switches; Switching circuits; Transmission line matrix methods; Ultra large scale integration;
Journal_Title :
Solid-State Circuits, IEEE Journal of
