DocumentCode :
1129950
Title :
Comparison of two sets of low-order basis functions for tetrahedral VIE modeling
Author :
Kulkarni, S. ; Lemdiasov, R. ; Ludwig, R. ; Makarov, S.
Author_Institution :
ECE Dept., Worcester Polytech. Inst., MA, USA
Volume :
52
Issue :
10
fYear :
2004
Firstpage :
2789
Lastpage :
2795
Abstract :
A convergence study is made for the two types of low-order basis functions for the volume integral equation (VIE). Both functions impose the continuity of the normal component of the electric flux through the faces. The one basis function is that of Schaubert, Wilton, and Glisson (1984) and is face-based. Another basis function was first introduced by de Carvalho and de Souza Mendes (1999) and is edge-based. The exact number of unknowns for the edge-based functions is determined in this study. The study demonstrates a better performance of the edge-based basis functions compared to the face-based bases. First, the edge-based basis functions have nearly the same or a faster convergence rate for equal tetrahedral meshes. They also show a high numerical stability. Second, for the same tetrahedral mesh, the number of unknowns for the edge-based functions is considerably smaller. The ratio of unknowns (edge-based versus face-based) ranges from 0.6 for rough plate meshes to approximately 0.5 for large volumetric meshes. Third, the edge-based functions are piecewise constant and are easily implemented into the method of moments. Their disadvantage is a preliminary condition "operation," which implies the elimination of the space of the basis set.
Keywords :
electromagnetic wave scattering; integral equations; mesh generation; method of moments; numerical stability; convergence; edge-based basis functions; edge-based functions; electric flux; equal tetrahedral meshes; low-order basis functions; method of moments; rough plate meshes; scattering; tetrahedral VIE modeling; volume integral equation; Computational complexity; Convergence; Dielectric materials; Integral equations; Moment methods; Numerical stability; Permittivity; Resonance; Robustness; Scattering; Edge basis functions; MoM; method of moments; scattering; volume integral equation;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2004.834377
Filename :
1341641
Link To Document :
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