• DocumentCode
    1130024
  • Title

    Thermal Hysteresis Analysis of MEMS Pressure Sensors

  • Author

    Chiou, Albert J. ; Chen, Steven

  • Author_Institution
    Motorola Inc., Deer Park, IL, USA
  • Volume
    14
  • Issue
    4
  • fYear
    2005
  • Firstpage
    782
  • Lastpage
    787
  • Abstract
    Thermal hysteresis reduction is usually a difficult task to tackle for micromachined pressure sensors especially when shrinking piezoresistive transducer (PRT) sensing elements. Since thermal hysteresis involves the entire thermal cycling history and complicated material properties that vary with temperatures, viscoplastic deformation makes the problem very complicated when dealing with high-precision sensor signals. The approach to simplify and quickly resolve the thermal hysteresis problem is the key methodology proposed by this paper. It is found the layout and volume of metal pads and runners have significant impact on the thermal hysteresis voltage shift. Strategically, we may move the aluminum bond pads away from the transducer and reduce the bond pad size to lower down the effect from the thermal stress hysteresis of aluminum on a silicon sensing element. \\hfill \\hbox {[1395]}
  • Keywords
    finite element analysis; hysteresis; micromechanical devices; piezoelectric transducers; pressure sensors; MEMS pressure sensors; finite element analysis; microelectro-mechanical systems; piezoresistive transducer; thermal hysteresis analysis; thermal stress hysteresis; viscoplastic deformation; Aluminum; Bonding; History; Hysteresis; Micromechanical devices; Piezoresistance; Temperature sensors; Thermal sensors; Thermal stresses; Transducers; Finite element analysis (FEA); microelectromechanical systems (MEMS) pressure sensor; piezoresistive transducer (PRT); thermal hysteresis;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2005.845460
  • Filename
    1492430