DocumentCode
1130024
Title
Thermal Hysteresis Analysis of MEMS Pressure Sensors
Author
Chiou, Albert J. ; Chen, Steven
Author_Institution
Motorola Inc., Deer Park, IL, USA
Volume
14
Issue
4
fYear
2005
Firstpage
782
Lastpage
787
Abstract
Thermal hysteresis reduction is usually a difficult task to tackle for micromachined pressure sensors especially when shrinking piezoresistive transducer (PRT) sensing elements. Since thermal hysteresis involves the entire thermal cycling history and complicated material properties that vary with temperatures, viscoplastic deformation makes the problem very complicated when dealing with high-precision sensor signals. The approach to simplify and quickly resolve the thermal hysteresis problem is the key methodology proposed by this paper. It is found the layout and volume of metal pads and runners have significant impact on the thermal hysteresis voltage shift. Strategically, we may move the aluminum bond pads away from the transducer and reduce the bond pad size to lower down the effect from the thermal stress hysteresis of aluminum on a silicon sensing element. ![\\hfill \\hbox {[1395]}](/images/tex/14992.gif)
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Keywords
finite element analysis; hysteresis; micromechanical devices; piezoelectric transducers; pressure sensors; MEMS pressure sensors; finite element analysis; microelectro-mechanical systems; piezoresistive transducer; thermal hysteresis analysis; thermal stress hysteresis; viscoplastic deformation; Aluminum; Bonding; History; Hysteresis; Micromechanical devices; Piezoresistance; Temperature sensors; Thermal sensors; Thermal stresses; Transducers; Finite element analysis (FEA); microelectromechanical systems (MEMS) pressure sensor; piezoresistive transducer (PRT); thermal hysteresis;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/JMEMS.2005.845460
Filename
1492430
Link To Document