DocumentCode
1130079
Title
Time-delay and memory effects in GaAs1-x Px injection laser
Author
Pankove, Jacques I.
Author_Institution
RCA Laboratories, Princeton, NJ, USA
Volume
4
Issue
4
fYear
1968
fDate
4/1/1968 12:00:00 AM
Firstpage
161
Lastpage
163
Abstract
The delay between turn-on of current and onset of lasing was measured in a GaAs0.60 P0.40 injection laser as a function of current. The delay can be as long as 700 ns but decreases with overdrive. The trap density is estimated at 1019cm-3. A double-pulse experiment shows that the memory of the first pulse may persist for longer than a millisecond. A burst-of-pulses experiment indicates that the traps cannot be emptied optically by stimulated emission. A reverse bias was not able to empty the traps electrically.
Keywords
Current measurement; Delay effects; Diodes; Electron traps; Gallium arsenide; Optical materials; Optical pulses; P-n junctions; Stimulated emission; Temperature;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1968.1075054
Filename
1075054
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