• DocumentCode
    1130079
  • Title

    Time-delay and memory effects in GaAs1-xPxinjection laser

  • Author

    Pankove, Jacques I.

  • Author_Institution
    RCA Laboratories, Princeton, NJ, USA
  • Volume
    4
  • Issue
    4
  • fYear
    1968
  • fDate
    4/1/1968 12:00:00 AM
  • Firstpage
    161
  • Lastpage
    163
  • Abstract
    The delay between turn-on of current and onset of lasing was measured in a GaAs0.60P0.40injection laser as a function of current. The delay can be as long as 700 ns but decreases with overdrive. The trap density is estimated at 1019cm-3. A double-pulse experiment shows that the memory of the first pulse may persist for longer than a millisecond. A burst-of-pulses experiment indicates that the traps cannot be emptied optically by stimulated emission. A reverse bias was not able to empty the traps electrically.
  • Keywords
    Current measurement; Delay effects; Diodes; Electron traps; Gallium arsenide; Optical materials; Optical pulses; P-n junctions; Stimulated emission; Temperature;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1968.1075054
  • Filename
    1075054