Title :
Time-delay and memory effects in GaAs1-xPxinjection laser
Author :
Pankove, Jacques I.
Author_Institution :
RCA Laboratories, Princeton, NJ, USA
fDate :
4/1/1968 12:00:00 AM
Abstract :
The delay between turn-on of current and onset of lasing was measured in a GaAs0.60P0.40injection laser as a function of current. The delay can be as long as 700 ns but decreases with overdrive. The trap density is estimated at 1019cm-3. A double-pulse experiment shows that the memory of the first pulse may persist for longer than a millisecond. A burst-of-pulses experiment indicates that the traps cannot be emptied optically by stimulated emission. A reverse bias was not able to empty the traps electrically.
Keywords :
Current measurement; Delay effects; Diodes; Electron traps; Gallium arsenide; Optical materials; Optical pulses; P-n junctions; Stimulated emission; Temperature;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1968.1075054