Title :
Comments on "On deembedding of port discontinuities in full-wave CAD models of multiport circuits"
Author :
Rautio, James C.
Author_Institution :
Sonnet Software Inc., North Syracuse, NY, USA
Abstract :
For original paper see Okhmatovski et al. (IEEE Trans. Microwave Theory Tech., vol.51, p.2355-65, Dec. 2003). The present author provides some additional comments on electromagnetic deembedding.
Keywords :
circuit CAD; multiport networks; electromagnetic deembedding; full-wave CAD models; multiport circuits; port discontinuities deembedding; Admittance; Circuits; Delay; Electromagnetic modeling; Failure analysis; Impedance; Joining processes; Transmission line discontinuities; Transmission line matrix methods; Transmission lines;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2004.835912
