DocumentCode
1130827
Title
An Analytical Model for Predicting the Underfill Flow Characteristics in Flip-Chip Encapsulation
Author
Wan, J.W. ; Zhang, W.J. ; Bergstrom, D.J.
Author_Institution
Sch. of Civil Eng., Guangzhou Univ., China
Volume
28
Issue
3
fYear
2005
Firstpage
481
Lastpage
487
Abstract
This article describes an analytical model for the prediction of the underfill flow characteristics in a flip-chip package driven by capillary action. In this model, we consider non-Newtonian fluid properties of the encapsulant as opposed to most other studies where Newtonian fluid properties were assumed for the underfill flow. The power-law constitutive equation was applied in our study. The simulation based on this model agreed well with the measurement obtained from the experiments available in literature. It was further shown that this model performs better than the Washburn model traditionally used for the prediction of underfill flow characteristics in the flip-chip packaging. Based on this model, the effects of the solder bump pattern (including bump pitch, solder bump diameter, and gap height) on the process variables (i.e., flow front and filling time) were studied, which facilitated both the package design and the process optimization.
Keywords
capillarity; chip scale packaging; encapsulation; flip-chip devices; flow simulation; non-Newtonian flow; solders; Newtonian fluid properties; Washburn model; analytical model; capillary action; flip-chip encapsulation; flip-chip package; nonNewtonian fluid properties; package design; power-law constitutive equation; process optimization; process variables; solder bump pattern; surface tension; underfill flow characteristics; Analytical models; Costs; Electronics packaging; Encapsulation; Equations; Integrated circuit packaging; Integrated circuit technology; Predictive models; Soldering; Thermal stresses; Analytical model; Washburn model; flip-chip package; power-law constitutive equation; surface tension; underfill flow;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/TADVP.2005.848385
Filename
1492517
Link To Document