Title :
Probability of error analysis of BPSK OFDM systems with random residual frequency offset
Author :
Weeraddana, P.C. ; Rajatheva, Nandana ; Minn, H.
Author_Institution :
Sch. of Eng. Technol., Telecommun. Field of Study, Pathumthani
fDate :
1/1/2009 12:00:00 AM
Abstract :
In this paper, we derive closed form bit error rate (BER) expressions for orthogonal frequency division multiplexing (OFDM) systems with residual carrier frequency offset (CFO). Most of the published work treats CFO as a nonrandom parameter. But in our study we consider it as a random parameter. The BER performance of binary phase shift keying (BPSK) OFDM system is analyzed in the cases of additive white Gaussian noise (AWGN), frequency-flat and frequency-selective Rayleigh fading channels.We further discuss how these expressions can be related to systems with practical estimators. The simulation results are provided to verify the accuracy of these error rate expressions.
Keywords :
AWGN channels; OFDM modulation; Rayleigh channels; error statistics; phase shift keying; random processes; AWGN channel; BER expression; BPSK OFDM system; additive white Gaussian noise; binary phase shift keying; bit error rate; error probability analysis; frequency-flat Rayleigh fading channel; frequency-selective Rayleigh fading channel; orthogonal frequency division multiplexing; random residual carrier frequency offset; AWGN; Additive white noise; Binary phase shift keying; Bit error rate; Error analysis; Frequency estimation; Frequency shift keying; OFDM; Performance analysis; Rayleigh channels; Probability density function (pdf), frequency offset, inter-carrier interference, frequency-selective fading, frequency-flat fading, Cramer-Rao lower bound (CRB);
Journal_Title :
Communications, IEEE Transactions on
DOI :
10.1109/TCOMM.2009.0901.060683
