DocumentCode :
1131343
Title :
Moore´s law lives on [CMOS transistors]
Author :
Chang, Leland ; Choi, Yang-Kyu ; Kedzierski, Jakub ; Lindert, Nick ; Xuan, Peiqi ; Bokor, Jeffrey ; Hu, Chenming ; King, Tsu-Jae
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Volume :
19
Issue :
1
fYear :
2003
fDate :
1/1/2003 12:00:00 AM
Firstpage :
35
Lastpage :
42
Abstract :
We discuss several device structures suitable for scaling CMOS devices well into the nano-CMOS era, perhaps down below 10 nm physical gate length. The ultra-thin body MOSFET device structure has many features in common with today\´s bulk MOSFET, which makes it easier for industry to introduce into manufacturing. On the other hand, the double-gate structure as represented by the FinFET appears to offer greater scalability down to 10 nm gate length or perhaps even below. While a number of significant challenges remain to be overcome, including device parasitics, interfaces, and threshold voltage control techniques, it appears that the continued evolution of CMOS integrated circuit technology into this regime will not be impeded by basic limitations of the underlying transistor technology. The implication of this is that "Moore\´s law" may continue for yet another 15-20 years before the ultimate device limits for CMOS are reached.
Keywords :
CMOS integrated circuits; MOSFET; nanotechnology; silicon-on-insulator; solid phase epitaxial growth; 10 nm; CMOS device scaling; CMOS integrated circuit technology evolution; Moore´s law; SOI film; channel film thickness; device parasitics; double-gate structure FinFET; gate length scaling limits; interfaces; nano-CMOS era; physical gate length; scalability; silicide S/D technology; solid phase epitaxy; threshold voltage control techniques; ultra-thin body MOSFET; CMOS technology; FinFETs; Integrated circuit technology; MOSFET circuits; Manufacturing industries; Moore´s Law; Nanoscale devices; Scalability; Threshold voltage; Voltage control;
fLanguage :
English
Journal_Title :
Circuits and Devices Magazine, IEEE
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/MCD.2003.1175106
Filename :
1175106
Link To Document :
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