• DocumentCode
    1131648
  • Title

    Finite-element modeling of silica waveguide amplifiers with high erbium concentration

  • Author

    Di Pasquale, Fabrizio ; Zoboli, Maurizio ; Federigh, Marco ; Massarek, Ilana

  • Author_Institution
    Dipartimento di Ingegneria dell´´Inf., Parma Univ., Italy
  • Volume
    30
  • Issue
    5
  • fYear
    1994
  • fDate
    5/1/1994 12:00:00 AM
  • Firstpage
    1277
  • Lastpage
    1282
  • Abstract
    We report numerical analysis of planar and channel silica waveguide amplifiers with high erbium concentration. The numerical approach is based on the combined use of a full-vectorial finite-element method and the Runge-Kutta algorithm. It allows one to investigate real structures, accounting for both the active ions interactions by cross-relaxation and upconversion and the effects of waveguide geometry and refractive index profile. We show that, depending on input pump power and waveguide structure, ion-ion interactions affect the amplifier performance for high erbium concentrations. A three-dimensional waveguide designed for single-mode operation ensures higher pumping efficiency and lower noise characteristics than a two-dimensional one and seems to be the best candidate to overcome this drawback
  • Keywords
    Runge-Kutta methods; erbium; finite element analysis; optical waveguide theory; optical waveguides; solid lasers; Runge-Kutta algorithm; SiO2:Er; active ion-ion interactions; channel waveguide; cross-relaxation; erbium concentration; full-vectorial finite-element model; noise characteristics; numerical analysis; planar waveguide; pumping efficiency; refractive index profile; silica waveguide amplifiers; single-mode operation; three-dimensional waveguide; upconversion; Electromagnetic waveguides; Erbium; Erbium-doped fiber amplifier; Finite element methods; Geometry; Optical amplifiers; Optical waveguides; Planar waveguides; Refractive index; Silicon compounds;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.303693
  • Filename
    303693