Title :
Absolute frequency measurements in the far infrared
Author_Institution :
Massachusetts Institute of Technology, Cambridge, MA, USA
fDate :
5/1/1968 12:00:00 AM
Keywords :
Dielectric losses; Filling; Frequency measurement; Gaussian processes; High-K gate dielectrics; Magnetic fields; Masers; Operational amplifiers; Resonance; Resonant frequency;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1968.1075247
