DocumentCode
1131871
Title
Absolute frequency measurements in the far infrared
Author
Javan, A.
Author_Institution
Massachusetts Institute of Technology, Cambridge, MA, USA
Volume
4
Issue
5
fYear
1968
fDate
5/1/1968 12:00:00 AM
Firstpage
324
Lastpage
324
Keywords
Dielectric losses; Filling; Frequency measurement; Gaussian processes; High-K gate dielectrics; Magnetic fields; Masers; Operational amplifiers; Resonance; Resonant frequency;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1968.1075247
Filename
1075247
Link To Document