Title :
A recursive multiple model approach to noise identification
Author :
Li, X. Rong ; Shalom, Yaakov Bar
Author_Institution :
Dept. of Electr. Eng., Hartford Univ., West Hartford, CT, USA
fDate :
7/1/1994 12:00:00 AM
Abstract :
Correct knowledge of noise statistics is essential for an estimator or controller to have reliable performance. In practice, however, the noise statistics are unknown or not known perfectly and thus need to be identified. Previous work on noise identification is limited to stationary noise and noise with slowly varying statistics only. An approach is presented here that is valid for nonstationary noise with rapidly or slowly varying statistics as well as stationary noise. This approach is based on the estimation with multiple hybrid system models. As one of the most cost-effective estimation schemes for hybrid system, the interacting multiple model (IMM) algorithm is used in this approach. The IMM algorithm has two desirable properties: it is recursive and has fixed computational requirements per cycle. The proposed approach is evaluated via a number of representative examples by both Monte Carlo simulations and a nonsimulation technique of performance prediction developed by the authors recently. The application of the proposed approach to failure detection is also illustrated
Keywords :
Monte Carlo methods; adaptive filters; estimation theory; filtering and prediction theory; linear systems; parameter estimation; random noise; statistical analysis; Monte Carlo simulations; computational requirements; cost-effective estimation; failure detection; interacting multiple model algorithm; multiple hybrid system models; noise identification; noise statistics; nonstationary noise; performance evaluation; performance prediction; rapidly varying statistics; recursive multiple model; slowly varying statistics; Electric variables measurement; Noise measurement; Sensor systems; Statistics; Stochastic resonance; Stochastic systems; Systems engineering and theory; Target tracking; Time measurement; Uncertainty;
Journal_Title :
Aerospace and Electronic Systems, IEEE Transactions on