Title :
Ultralow Current Measurements With Silicon-on-Sapphire Integrator Circuits
Author :
Culurciello, Eugenio ; Montanaro, Hazael ; Kim, Dongsoo
Author_Institution :
Dept. of Electr. Eng., Yale Univerity, New Haven, CT
fDate :
3/1/2009 12:00:00 AM
Abstract :
This letter reports the results on measurements and modeling of the ultralow current measurement capability of a silicon-on-sapphire current integrator circuit. We have tested the lowest possible current measurable with the device and the noise performance with picoampere input currents. The device is capable of resolving subpicoampere currents with an rms noise of 350 fA in a 110-Hz bandwidth. The device is also capable of digitally measuring currents up to 100 muA by employing a pulse-based A/D converters.
Keywords :
analogue-digital conversion; biomedical equipment; biosensors; circuit noise; electric current measurement; integrating circuits; biomedical equipment; noise performance; pulse-based A/D converter; silicon-on-sapphire integrator circuits; ultralow current measurement; Biomedical equipment; biomedical measurements; circuit noise;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2008.2010564
