DocumentCode :
11323
Title :
Prototype 250 GHz Bandwidth Chip to Chip Electrical Interconnect, Characterized With Ultrafast Optoelectronics
Author :
Jeong Sang Jo ; Tae-In Jeon ; Grischkowsky, Daniel Richard
Author_Institution :
Div. of Electr. & Electron. Eng., Korea Maritime Univ., Busan, South Korea
Volume :
3
Issue :
4
fYear :
2013
fDate :
Jul-13
Firstpage :
453
Lastpage :
460
Abstract :
We have connected two optoelectronic chips with air-spaced two-wire transmission lines and have observed essentially undistorted transmission of 1.8 ps (FWHM) electrical pulses over propagation distances up to 200 cm. The lines consist of two 0.4 mm (or 0.5 mm) diameter copper wires with centers separated by 1.0 mm. The air spaced two-wire lines show transform-limited TEM mode pulse propagation with very small group velocity dispersion (GVD), and relatively low attenuation. Our achieved performance with a power loss of 5.8 dB/m approaches that needed for mm-wave and THz interconnects. The coupling was enabled by two tungsten probes with 1 μm diameter tips in near-contact (5 μm gap) with the coplanar transmission lines on the transmitting and receiving optoelectronic chips. The air spaced two-wire line´s relatively small, measured pulse amplitude attenuation coefficient was 1.31 times larger than the theoretical prediction for the TEM mode. This discrepancy is considered to be primarily due to reduction of the Cu conductivity in the THz skin-depth layer.
Keywords :
coplanar transmission lines; copper; integrated optoelectronics; optical interconnections; tungsten; Cu; TEM mode pulse propagation; air spaced two-wire lines; bandwidth 250 GHz; chip to chip electrical interconnect; coplanar transmission lines; copper wires; group velocity dispersion; pulse amplitude attenuation coefficient; size 0.4 mm; size 0.5 mm; size 1 mum; terahertz skin-depth layer; two-wire transmission lines; ultrafast optoelectronics; Terahertz (THz); amplitude attenuation; low-loss; pulse propagation; two-wire;
fLanguage :
English
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-342X
Type :
jour
DOI :
10.1109/TTHZ.2013.2251930
Filename :
6494710
Link To Document :
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