Title :
A 3.1 GHz–8.0 GHz Single-Chip Transceiver for MB-OFDM UWB in 0.18-
m CMOS Process
Author :
Zheng, Hui ; Lou, Shuzuo ; Lu, Dongtian ; Shen, Cheng ; Chan, Tatfu ; Luong, Howard C.
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong
Abstract :
This paper presents the design and integration of a fully-integrated dual-conversion zero-IF2 CMOS transceiver for 9-band MB-OFDM UWB systems from 3.1 GHz to 8.0 GHz. The transceiver integrates all building blocks including a variable-gain wideband LNA, a single combined mixer for both RF down-conversion in RX and up-conversion in TX, a fast-settling frequency synthesizer, and IQ ADCs and DACs. Fabricated in a standard 0.18- mum CMOS process, the receiver measures maximum S11 of - 13 dB, maximum NF of 8.25 dB, in-band IIP3 of better than -13.7 dBm, and variable gain from 25.3 to 84.0 dB. IQ path gain and phase mismatches of the receiver chain are measured to be 0.8 dB and 4 deg, respectively. The transmitter achieves a minimum output P-1 dB of -8.2 dBm, sideband rejection of better than -42.2 dBc, and LO leakage of smaller than - 46.5 dBc.
Keywords :
MMIC; OFDM modulation; analogue-digital conversion; digital-analogue conversion; low noise amplifiers; microwave mixers; transceivers; ultra wideband communication; wideband amplifiers; CMOS process; DAC; IQ ADC; IQ path gain; LO leakage; MB-OFDM UWB; RF down-conversion; analog-digital converter; digital-analog converter; frequency 3.1 GHz to 8.0 GHz; fully-integrated dual-conversion zero-IF2 CMOS transceiver; gain 25.3 dB to 84.0 dB; noise figure 8.25 dB; phase mismatch; receiver chain; single combined mixer; single-chip transceiver; size 0.18 mum; variable-gain wideband LNA; CMOS process; Frequency synthesizers; Gain measurement; Measurement standards; Noise measurement; Phase measurement; Radio frequency; Transceivers; Transmitters; Wideband; Direct conversion; LNA; MB-OFDM; dual conversion; mixer; receiver; synthesizer; transceiver; transmitter; ultra-wideband (UWB); wideband; zero-IF;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2008.2010758