• DocumentCode
    1132741
  • Title

    A Fully Integrated 7.3 kV HBM ESD-Protected Transformer-Based 4.5–6 GHz CMOS LNA

  • Author

    Borremans, Jonathan ; Thijs, Steven ; Wambacq, Piet ; Rolain, Yves ; Linten, Dimitri ; Kuijk, Maarten

  • Author_Institution
    IMEC, Leuven
  • Volume
    44
  • Issue
    2
  • fYear
    2009
  • Firstpage
    344
  • Lastpage
    353
  • Abstract
    The increasing mask costs of modern scaled CMOS makes silicon area precious. Meanwhile, the lowering oxide thickness seriously toughens ESD protection of RF circuits, pushing towards area-demanding inductor-based ESD protection techniques. This paper presents a transformer-based ESD protection technique for inductor-based LNAs. With no area penalty, an ESD protection level of 4.5 kV HBM is achieved. Introducing two-stage protection increases the robustness up to 7.3 kV, maintaining excellent RF performance. Further it extends the TLP protection level from 3.2 to 5 A. A noise figure of 2.6 dB is achieved with a power gain of 14.8 dB, while consuming 6.5 mW. The technique serves as a solution for low-area highly protected LNAs in deep-submicron CMOS.
  • Keywords
    CMOS integrated circuits; circuit noise; circuit stability; electrostatic discharge; elemental semiconductors; inductors; integrated circuit design; integrated circuit modelling; low noise amplifiers; protection; radiofrequency integrated circuits; silicon; transformers; HBM ESD-protected transformer-based CMOS LNA; RF circuit; Si; TLP protection level; circuit design; current 3.2 A to 5 A; deep-submicron CMOS; frequency 4.5 GHz to 6 GHz; gain 14.8 dB; human body model; inductor-based LNA; noise figure; noise figure 2.6 dB; oxide thickness; power 6.5 mW; robustness; transformer-based ESD protection; two-stage protection; voltage 4.5 kV; voltage 7.3 kV; CMOS technology; Circuits; Clamps; Diodes; Electrostatic discharge; Inductors; Pins; Protection; Radio frequency; Stress; CMOS; ESD protection; low-noise amplifier; transformer;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2008.2010828
  • Filename
    4768884