Title :
A Fully Integrated 7.3 kV HBM ESD-Protected Transformer-Based 4.5–6 GHz CMOS LNA
Author :
Borremans, Jonathan ; Thijs, Steven ; Wambacq, Piet ; Rolain, Yves ; Linten, Dimitri ; Kuijk, Maarten
Author_Institution :
IMEC, Leuven
Abstract :
The increasing mask costs of modern scaled CMOS makes silicon area precious. Meanwhile, the lowering oxide thickness seriously toughens ESD protection of RF circuits, pushing towards area-demanding inductor-based ESD protection techniques. This paper presents a transformer-based ESD protection technique for inductor-based LNAs. With no area penalty, an ESD protection level of 4.5 kV HBM is achieved. Introducing two-stage protection increases the robustness up to 7.3 kV, maintaining excellent RF performance. Further it extends the TLP protection level from 3.2 to 5 A. A noise figure of 2.6 dB is achieved with a power gain of 14.8 dB, while consuming 6.5 mW. The technique serves as a solution for low-area highly protected LNAs in deep-submicron CMOS.
Keywords :
CMOS integrated circuits; circuit noise; circuit stability; electrostatic discharge; elemental semiconductors; inductors; integrated circuit design; integrated circuit modelling; low noise amplifiers; protection; radiofrequency integrated circuits; silicon; transformers; HBM ESD-protected transformer-based CMOS LNA; RF circuit; Si; TLP protection level; circuit design; current 3.2 A to 5 A; deep-submicron CMOS; frequency 4.5 GHz to 6 GHz; gain 14.8 dB; human body model; inductor-based LNA; noise figure; noise figure 2.6 dB; oxide thickness; power 6.5 mW; robustness; transformer-based ESD protection; two-stage protection; voltage 4.5 kV; voltage 7.3 kV; CMOS technology; Circuits; Clamps; Diodes; Electrostatic discharge; Inductors; Pins; Protection; Radio frequency; Stress; CMOS; ESD protection; low-noise amplifier; transformer;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2008.2010828