• DocumentCode
    1132799
  • Title

    A Module-Level Testing Approach for Combinational Networks

  • Author

    Batni, Ramachendra P. ; Kime, Charles R.

  • Issue
    6
  • fYear
    1976
  • fDate
    6/1/1976 12:00:00 AM
  • Firstpage
    594
  • Lastpage
    604
  • Abstract
    A module-level testing approach for combinational networks which employs hardware modification and a simplified test generation procedure is described. The approach is based on a directed graph model for the network derived at the module level. The objectives of the approach are to deal with testing directly at the module level, to use cataloged tests for the modules in the network environment, and to generate a fault detection test set with "good" fault location capability. Networks which consist of single-output modules are treated initially and then the results are extended to networks which consist of multiple-output modules. Hardware modification and test generation procedures are illustrated.
  • Keywords
    B-transformation, combinational networks, effective blocking technique, fault detection tests, module-level testing.; Circuit faults; Circuit simulation; Circuit testing; Digital systems; Electrical fault detection; Employment; Fault detection; Fault location; Hardware; Packaging; B-transformation, combinational networks, effective blocking technique, fault detection tests, module-level testing.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1976.1674659
  • Filename
    1674659