Abstract :
A nine-valued circuit model for test generation is introduced which takes care of multiple and repeated effects of a fault in sequential circuits. Using this model test sequences can be determined which allow multiple and repeated effects of faults on the internal state of a sequential circuit. Thus valid test sequences are derived where other known procedures, like the D-algorithm, do not find any test although one exists.
Keywords :
Circuit testing, D-algorithm, diagnosis, many-valued model, sequential circuit, single and multiple faults, test generation.; Asynchronous circuits; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Hazards; Information processing; Sequential analysis; Sequential circuits; Synchronous generators; Circuit testing, D-algorithm, diagnosis, many-valued model, sequential circuit, single and multiple faults, test generation.;
