DocumentCode
1132843
Title
A Nine-Valued Circuit Model for Test Generation
Author
Muth, Peter
Author_Institution
Brown, Boveri, and Cie AG
Issue
6
fYear
1976
fDate
6/1/1976 12:00:00 AM
Firstpage
630
Lastpage
636
Abstract
A nine-valued circuit model for test generation is introduced which takes care of multiple and repeated effects of a fault in sequential circuits. Using this model test sequences can be determined which allow multiple and repeated effects of faults on the internal state of a sequential circuit. Thus valid test sequences are derived where other known procedures, like the D-algorithm, do not find any test although one exists.
Keywords
Circuit testing, D-algorithm, diagnosis, many-valued model, sequential circuit, single and multiple faults, test generation.; Asynchronous circuits; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Hazards; Information processing; Sequential analysis; Sequential circuits; Synchronous generators; Circuit testing, D-algorithm, diagnosis, many-valued model, sequential circuit, single and multiple faults, test generation.;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1976.1674663
Filename
1674663
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