DocumentCode :
1132898
Title :
Fast Low Power eDRAM Hierarchical Differential Sense Amplifier
Author :
Schuster, Stanley E. ; Matick, Richard E.
Author_Institution :
Res. Div., Thomas J. Watson Res. Center, IBM, Yorktown Heights, NY
Volume :
44
Issue :
2
fYear :
2009
Firstpage :
631
Lastpage :
641
Abstract :
In this paper, a hierarchical differential sense amplifier for fast, low power DRAM arrays in logic-based eDRAM technology that operates with large parameter variations is described. Unique features of the hierarchical sense amplifier include its short local bit lines and a local half sense amplifier p device latch that is connected by a switch to a global half sense amplifier device latch. When the local and global half latches are connected by the switch, they form a conventional cross-coupled latch. As a result of the short bit lines, the magnitude of the differential signal is large enough to overcome device variations in the various pairs of like-devices of the sense amplifier. The differential sense amplifier is quite insensitive to absolute parameter variation and mainly sensitive to mismatches between paired devices. The hierarchical differential sense amplifier has very low static power due to the use of a sense voltage of approximately Vdd/2 which causes low leakage in the local and global sense amplifiers as well as in the storage cell. Low active power also results from this Vdd/2 sensing. In addition, simulation results show low latency, fast restore, and fast cycle time with clocking and timing that are relatively simple.
Keywords :
DRAM chips; differential amplifiers; flip-flops; low-power electronics; Vdd/2 sensing; cross-coupled latch; fast cycle time; global half sense amplifier device latch; hierarchical differential sense amplifier; local half sense amplifier; logic-based eDRAM technology; low active power; low power DRAM arrays; parameter variations; short local bit lines; storage cell; very low static power; Circuits; Clocks; Delay; Differential amplifiers; Latches; Logic arrays; Low-noise amplifiers; Random access memory; Switches; Voltage; clocked sensing cell restore; cross-coupled latch; device threshold mismatch; differential sensing; dummy cells; eDRAM; floating body effects; global bit lines; global sense amplifier; hierarchical bit line; hierarchical differential sensing; history effects; local bit lines; local sense amplifier; low active power; low leakage; low power; one-half Vdd sensing; reference V sensing; sense noise coupling; sensing stability to threshold mismatches; write speed;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2008.2010811
Filename :
4768898
Link To Document :
بازگشت